Recording at the Nanometer Scale on p-Nitrobenzonitrile Thin Films by Scanning Tunneling Microscopy: Fid-Bau Portal

Recording at the Nanometer Scale on p-Nitrobenzonitrile Thin Films by Scanning Tunneling Microscopy

Shi, D. X. / Song, Y. L. / Zhu, D. B. / Zhang, H. X. / Xie, S. S. / Pang, S. J. / Gao, H.-J.

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Recording at the Nanometer Scale on p-Nitrobenzonitrile Thin Films by Scanning Tunneling Microscopy

Shi, D. X. / Song, Y. L. / Zhu, D. B. / Zhang, H. X. / Xie, S. S. / Pang, S. J. / Gao, H.-J.

Recording at the Nanometer Scale on p-Nitrobenzonitrile Thin Films by Scanning Tunneling Microscopy

Shi, D. X. / Song, Y. L. / Zhu, D. B. / Zhang, H. X. / Xie, S. S. / Pang, S. J. / Gao, H.-J.

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Document information

Title:

Recording at the Nanometer Scale on p-Nitrobenzonitrile Thin Films by Scanning Tunneling Microscopy

Contributors:

Shi, D. X. (author) / Song, Y. L. (author) / Zhu, D. B. (author) / Zhang, H. X. (author) / Xie, S. S. (author) / Pang, S. J. (author) / Gao, H.-J. (author)

Published in:

ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 13 ; 1103-1105

Publication date:

2001-01-01

Size:

3 pages

ISSN:

0935-9648

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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Behm, R. J. / Hösler, W. | Springer Verlag | 1986