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Use of coherent X-ray diffraction to map strain fields in nanocrystals

Robinson, I. K. / Vartanyants, I. A.

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Use of coherent X-ray diffraction to map strain fields in nanocrystals

Robinson, I. K. / Vartanyants, I. A.

Use of coherent X-ray diffraction to map strain fields in nanocrystals

Robinson, I. K. / Vartanyants, I. A.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Use of coherent X-ray diffraction to map strain fields in nanocrystals

Contributors:

Robinson, I. K. (author) / Vartanyants, I. A. (author)

Published in:

APPLIED SURFACE SCIENCE ; 182 ; 186-191

Publication date:

2001-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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