Coherent X-Ray Diffraction Imaging and Characterization of Strain in Silicon-on-Insulator Nanostructures: Fid-Bau Portal

Coherent X-Ray Diffraction Imaging and Characterization of Strain in Silicon-on-Insulator Nanostructures

Xiong, G. / Moutanabbir, O. / Reiche, M. / Harder, R. / Robinson, I.

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Coherent X-Ray Diffraction Imaging and Characterization of Strain in Silicon-on-Insulator Nanostructures

Xiong, G. / Moutanabbir, O. / Reiche, M. / Harder, R. / Robinson, I.

Coherent X-Ray Diffraction Imaging and Characterization of Strain in Silicon-on-Insulator Nanostructures

Xiong, G. / Moutanabbir, O. / Reiche, M. / Harder, R. / Robinson, I.

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Check availability in my library

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Document information

Title:

Coherent X-Ray Diffraction Imaging and Characterization of Strain in Silicon-on-Insulator Nanostructures

Contributors:

Xiong, G. (author) / Moutanabbir, O. (author) / Reiche, M. (author) / Harder, R. (author) / Robinson, I. (author)

Published in:

ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 26 ; 7747-7763

Publication date:

2014-01-01

Size:

17 pages

ISSN:

0935-9648

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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