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The impact of defects to minority-carrier dynamics in heavily doped GaAs:C analyzed by transient photoluminescence spectroscopy
The impact of defects to minority-carrier dynamics in heavily doped GaAs:C analyzed by transient photoluminescence spectroscopy
The impact of defects to minority-carrier dynamics in heavily doped GaAs:C analyzed by transient photoluminescence spectroscopy
Tomm, J. W. (author) / Maadorf, A. (author) / Mazur, Y. I. (author) / Gramlich, S. (author) / Richter, E. (author) / Brunner, F. (author) / Weyers, M. (author) / Trankle, G. (author) / Malyarchuk, V. (author) / Gunther, T. (author)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 91-92 ; 25 - 28
2002-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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