A platform for research: civil engineering, architecture and urbanism
Application of UV Scanning Photoluminescence Spectroscopy for Minority Carrier Lifetime Mapping
Application of UV Scanning Photoluminescence Spectroscopy for Minority Carrier Lifetime Mapping
Application of UV Scanning Photoluminescence Spectroscopy for Minority Carrier Lifetime Mapping
Masarotto, L. (author) / Bluet, J. M. (author) / El Harrouni, I. (author) / Guillot, G. (author) / Bergman, P. / Janzen, E.
2003-01-01
4 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Minority carrier lifetime and metallic-impurity mapping in silicon wafers
British Library Online Contents | 2001
|Mapping of minority carrier lifetime and mobility in imperfect silicon wafers
British Library Online Contents | 2003
|Minority carrier lifetime scan maps applied to iron concentration mapping in silicon wafers
British Library Online Contents | 2002
|High-Resolution Time-Resolved Carrier Lifetime and Photoluminescence Mapping of 4H-SiC Epilayers
British Library Online Contents | 2012
|British Library Online Contents | 1994
|