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    Anelastic spectroscopy as a probe for the structure and dynamics of defects in semiconductors

    New search for: Palumbo, O.
    New search for: Cordero, F.
    New search for: Cantelli, R.
    New search for: Trequattrini, F.
    New search for: Molinas, B.
    New search for: Guadalupi, G. M.

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    Anelastic spectroscopy as a probe for the structure and dynamics of defects in semiconductors

    New search for: Palumbo, O.
    New search for: Cordero, F.
    New search for: Cantelli, R.
    New search for: Trequattrini, F.
    New search for: Molinas, B.
    New search for: Guadalupi, G. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Anelastic spectroscopy as a probe for the structure and dynamics of defects in semiconductors

    New search for: Palumbo, O.
    New search for: Cordero, F.
    New search for: Cantelli, R.
    New search for: Trequattrini, F.
    New search for: Molinas, B.
    New search for: Guadalupi, G. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Anelastic spectroscopy as a probe for the structure and dynamics of defects in semiconductors

    Contributors:

    Palumbo, O. (author) / Cordero, F. (author) / Cantelli, R. (author) / Trequattrini, F. (author) / Molinas, B. (author) / Guadalupi, G. M. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 91-92 ; 498 - 502

    Publication date:

    2002-01-01

    Size:

    5 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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