Investigation of Structural Defects during 4H-SiC Schottky Diode Processing by Synchrotron Topography: Fid-Bau Portal

Investigation of Structural Defects during 4H-SiC Schottky Diode Processing by Synchrotron Topography

Pernot, E. / Neyret, E. / Moulin, C. / Pernot-Rejmankova, P. / Templier, F. / Di Cioccio, L. / Billon, T. / Madar, R.

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Investigation of Structural Defects during 4H-SiC Schottky Diode Processing by Synchrotron Topography

Pernot, E. / Neyret, E. / Moulin, C. / Pernot-Rejmankova, P. / Templier, F. / Di Cioccio, L. / Billon, T. / Madar, R.

Investigation of Structural Defects during 4H-SiC Schottky Diode Processing by Synchrotron Topography

Pernot, E. / Neyret, E. / Moulin, C. / Pernot-Rejmankova, P. / Templier, F. / Di Cioccio, L. / Billon, T. / Madar, R.

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Title:

Investigation of Structural Defects during 4H-SiC Schottky Diode Processing by Synchrotron Topography

Contributors:

Pernot, E. (author) / Neyret, E. (author) / Moulin, C. (author) / Pernot-Rejmankova, P. (author) / Templier, F. (author) / Di Cioccio, L. (author) / Billon, T. (author) / Madar, R. (author)

Published in:

MATERIALS SCIENCE FORUM ; 389/393 ; 419-422

Publication date:

2002-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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Chung, H. / Raghothamachar, B. / Dudley, M. et al. | British Library Conference Proceedings | 1996

Synchrotron topography characterization of ZnTe single crystals

Zhou, W. / Dudley, M. / Wu, J. et al. | British Library Online Contents | 1994

Effect of Proton Irradiation Induced Defects on 4H-SiC Schottky Diode X-Ray Detectors

Stevens, R.C. / Vasilevskiy, K. / Lees, J.E. et al. | British Library Online Contents | 2011