Investigation of Defects in 4H-SiC by Synchrotron Topography, Raman Spectroscopy Imaging and Photoluminescence Spectroscopy Imaging: Fid-Bau Portal

Investigation of Defects in 4H-SiC by Synchrotron Topography, Raman Spectroscopy Imaging and Photoluminescence Spectroscopy Imaging

Pernot, E. / El Harrouni, I. / Mermoux, M. / Bluet, J. M. / Anikin, M. / Chaussende, D. / Pons, M. / Madar, R.

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Investigation of Defects in 4H-SiC by Synchrotron Topography, Raman Spectroscopy Imaging and Photoluminescence Spectroscopy Imaging

Pernot, E. / El Harrouni, I. / Mermoux, M. / Bluet, J. M. / Anikin, M. / Chaussende, D. / Pons, M. / Madar, R.

Investigation of Defects in 4H-SiC by Synchrotron Topography, Raman Spectroscopy Imaging and Photoluminescence Spectroscopy Imaging

Pernot, E. / El Harrouni, I. / Mermoux, M. / Bluet, J. M. / Anikin, M. / Chaussende, D. / Pons, M. / Madar, R.

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Check availability in my library

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Document information

Title:

Investigation of Defects in 4H-SiC by Synchrotron Topography, Raman Spectroscopy Imaging and Photoluminescence Spectroscopy Imaging

Contributors:

Pernot, E. (author) / El Harrouni, I. (author) / Mermoux, M. (author) / Bluet, J. M. (author) / Anikin, M. (author) / Chaussende, D. (author) / Pons, M. (author) / Madar, R. (author) / Bergman, P. / Janzen, E.

Published in:

Silicon Carbide and Related Materials 2002 ; 265-268

MATERIALS SCIENCE FORUM ; 433/436

Publication date:

2003-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Tuomi, Turkka O. | TIBKAT | 1981

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Masarotto, L. / Bluet, J. M. / Berenguer, M. et al. | British Library Online Contents | 2001

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Jokerst, J.V. / Pohling, C. / Gambhir, S.S. | British Library Online Contents | 2013

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Ivanov, I.G. / Gallstrom, A. / Coble, R. et al. | British Library Online Contents | 2012