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Continuum and atomistic modeling of electromechanically-induced failure of ductile metallic thin films
Continuum and atomistic modeling of electromechanically-induced failure of ductile metallic thin films
Continuum and atomistic modeling of electromechanically-induced failure of ductile metallic thin films
Maroudas, D. (author) / Rauf Gungor, M. (author)
COMPUTATIONAL MATERIALS SCIENCE ; 23 ; 242-249
2002-01-01
8 pages
Article (Journal)
English
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