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Continuum and atomistic modeling of electromechanically-induced failure of ductile metallic thin films
Continuum and atomistic modeling of electromechanically-induced failure of ductile metallic thin films
Continuum and atomistic modeling of electromechanically-induced failure of ductile metallic thin films
Maroudas, D. (Autor:in) / Rauf Gungor, M. (Autor:in)
COMPUTATIONAL MATERIALS SCIENCE ; 23 ; 242-249
01.01.2002
8 pages
Aufsatz (Zeitschrift)
Englisch
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