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    Spectroscopic ellipsometry of non-absorbing films independent of film thickness

    New search for: Marton, J. C.
    New search for: Gomez-Pedrero, J. A.

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    Spectroscopic ellipsometry of non-absorbing films independent of film thickness

    New search for: Marton, J. C.
    New search for: Gomez-Pedrero, J. A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Spectroscopic ellipsometry of non-absorbing films independent of film thickness

    New search for: Marton, J. C.
    New search for: Gomez-Pedrero, J. A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Spectroscopic ellipsometry of non-absorbing films independent of film thickness

    Contributors:

    Marton, J. C. (author) / Gomez-Pedrero, J. A. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 193 ; 268-276

    Publication date:

    2002-01-01

    Size:

    9 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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