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Interfacial microstructure evolution between eutectic SnAgCu solder and Al/Ni(V)/Cu thin films
Interfacial microstructure evolution between eutectic SnAgCu solder and Al/Ni(V)/Cu thin films
Interfacial microstructure evolution between eutectic SnAgCu solder and Al/Ni(V)/Cu thin films
Li, M. (author) / Zhang, F. (author) / Chen, W. T. (author) / Zeng, K. (author) / Tu, K. N. (author) / Balkan, H. (author) / Elenius, P. (author)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 17 ; 1612-1621
2002-01-01
10 pages
Article (Journal)
English
DDC:
620.11
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