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Interfacial microstructure evolution between eutectic SnAgCu solder and Al/Ni(V)/Cu thin films
Interfacial microstructure evolution between eutectic SnAgCu solder and Al/Ni(V)/Cu thin films
Interfacial microstructure evolution between eutectic SnAgCu solder and Al/Ni(V)/Cu thin films
Li, M. (Autor:in) / Zhang, F. (Autor:in) / Chen, W. T. (Autor:in) / Zeng, K. (Autor:in) / Tu, K. N. (Autor:in) / Balkan, H. (Autor:in) / Elenius, P. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 17 ; 1612-1621
01.01.2002
10 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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