Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Defect study on ion-implanted Si by coincidence Doppler broadening measurements

    New search for: Akahane, T.
    New search for: Fujinami, M.
    New search for: Sawada, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Defect study on ion-implanted Si by coincidence Doppler broadening measurements

    New search for: Akahane, T.
    New search for: Fujinami, M.
    New search for: Sawada, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Defect study on ion-implanted Si by coincidence Doppler broadening measurements

    New search for: Akahane, T.
    New search for: Fujinami, M.
    New search for: Sawada, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Defect study on ion-implanted Si by coincidence Doppler broadening measurements

    Contributors:

    Akahane, T. (author) / Fujinami, M. (author) / Sawada, T. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 194 ; 116-121

    Publication date:

    2002-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Defect Study on Si Implanted with B and BF~2 Ions by Coincidence Doppler Broadening Measurements

    Akahane, T. / Fujinami, M. / Ohnishi, K. et al. | British Library Online Contents | 2001

    Doppler Broadening Coincidence Studies

    Weber, M. H. | British Library Online Contents | 2001

    Defects in GaSb Studied by Coincidence Doppler Broadening Measurements

    Hu, W. G. / Wang, Z. / Dai, Y. Q. et al. | British Library Online Contents | 2004

    Software for Digital Coincidence Doppler Broadening Setup

    Petriska, M. / Sabelova, V. / Slugen, V. et al. | British Library Online Contents | 2013

    Optimized Coincidence Doppler Broadening Spectroscopy Using Deconvolution Algorithms

    Ho, K. F. / Ching, H. M. / Cheng, K. W. et al. | British Library Online Contents | 2004

    Back to top