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    Spectroscopic ellipsometry studies of amorphous PZT thin films with various Zr/Ti stoichiometries

    New search for: Yang, S.
    New search for: Mo, D.
    New search for: Tang, X.

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    Spectroscopic ellipsometry studies of amorphous PZT thin films with various Zr/Ti stoichiometries

    New search for: Yang, S.
    New search for: Mo, D.
    New search for: Tang, X.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Spectroscopic ellipsometry studies of amorphous PZT thin films with various Zr/Ti stoichiometries

    New search for: Yang, S.
    New search for: Mo, D.
    New search for: Tang, X.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Spectroscopic ellipsometry studies of amorphous PZT thin films with various Zr/Ti stoichiometries

    Contributors:

    Yang, S. (author) / Mo, D. (author) / Tang, X. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 37 ; 3841 - 3845

    Publication date:

    2002-01-01

    Size:

    5 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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