Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Characterization of amorphous organic thin films, determination of precise model for spectroscopic ellipsometry measurements

    New search for: Farahzadi, A.
    New search for: Beigmohamadi, M.
    New search for: Niyamakom, P.
    New search for: Kremers, S.
    New search for: Meyer, N.
    New search for: Heuken, M.
    New search for: Wuttig, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Characterization of amorphous organic thin films, determination of precise model for spectroscopic ellipsometry measurements

    New search for: Farahzadi, A.
    New search for: Beigmohamadi, M.
    New search for: Niyamakom, P.
    New search for: Kremers, S.
    New search for: Meyer, N.
    New search for: Heuken, M.
    New search for: Wuttig, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of amorphous organic thin films, determination of precise model for spectroscopic ellipsometry measurements

    New search for: Farahzadi, A.
    New search for: Beigmohamadi, M.
    New search for: Niyamakom, P.
    New search for: Kremers, S.
    New search for: Meyer, N.
    New search for: Heuken, M.
    New search for: Wuttig, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Characterization of amorphous organic thin films, determination of precise model for spectroscopic ellipsometry measurements

    Contributors:

    Farahzadi, A. (author) / Beigmohamadi, M. (author) / Niyamakom, P. (author) / Kremers, S. (author) / Meyer, N. (author) / Heuken, M. (author) / Wuttig, M. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 256 ; 6612-6617

    Publication date:

    2010-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Spectroscopic ellipsometry studies of amorphous PZT thin films with various Zr/Ti stoichiometries

    Yang, S. / Mo, D. / Tang, X. | British Library Online Contents | 2002

    Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry

    Schmiedova, V. / Heinrichova, P. / Zmeskal, O. et al. | British Library Online Contents | 2015

    Spectroscopic ellipsometry characterization of amorphous and crystalline TiO2 thin films grown by atomic layer deposition at different temperatures

    Saha, D. / Ajimsha, R.S. / Rajiv, K. et al. | British Library Online Contents | 2014

    Spectroscopic ellipsometry characterization of amorphous and crystalline TiO"2 thin films grown by atomic layer deposition at different temperatures

    Saha, D. / Ajimsha, R. S. / Rajiv, K. et al. | British Library Online Contents | 2014

    Spectroscopic ellipsometry characterization of ZrO2 thin films by nitrogen-assisted reactive magnetron sputtering

    Zhu, L. Q. / Fang, Q. / He, G. et al. | British Library Online Contents | 2006

    Back to top