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SIMS and RBS study of thermally annealed Pd/b-SiC interfaces

Roy, S. / Basu, S. / Jacob, C. / Tyagi, A. K.

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SIMS and RBS study of thermally annealed Pd/b-SiC interfaces

Roy, S. / Basu, S. / Jacob, C. / Tyagi, A. K.

SIMS and RBS study of thermally annealed Pd/b-SiC interfaces

Roy, S. / Basu, S. / Jacob, C. / Tyagi, A. K.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

SIMS and RBS study of thermally annealed Pd/b-SiC interfaces

Contributors:

Roy, S. (author) / Basu, S. (author) / Jacob, C. (author) / Tyagi, A. K. (author)

Published in:

APPLIED SURFACE SCIENCE ; 202 ; 73-79

Publication date:

2002-01-01

Size:

7 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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