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Determination of the variation in sputter yield in the SIMS transient region using MEIS
Determination of the variation in sputter yield in the SIMS transient region using MEIS
Determination of the variation in sputter yield in the SIMS transient region using MEIS
Dowsett, M. G. (author) / Ormsby, T. J. (author) / Gard, F. S. (author) / Al-Harthi, S. H. (author) / Guzman, B. (author) / McConville, C. F. (author) / Noakes, T. C. (author) / Bailey, P. (author)
APPLIED SURFACE SCIENCE ; 203-204 ; 363-366
2003-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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