Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Depth scale calibration of SIMS depth profiles by means of an online crater depth measurement technique

    New search for: De Chambost, E.
    New search for: Monsallut, P.
    New search for: Rasser, B.
    New search for: Schuhmacher, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Depth scale calibration of SIMS depth profiles by means of an online crater depth measurement technique

    New search for: De Chambost, E.
    New search for: Monsallut, P.
    New search for: Rasser, B.
    New search for: Schuhmacher, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Depth scale calibration of SIMS depth profiles by means of an online crater depth measurement technique

    New search for: De Chambost, E.
    New search for: Monsallut, P.
    New search for: Rasser, B.
    New search for: Schuhmacher, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Depth scale calibration of SIMS depth profiles by means of an online crater depth measurement technique

    Contributors:

    De Chambost, E. (author) / Monsallut, P. (author) / Rasser, B. (author) / Schuhmacher, M. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 203-204 ; 391-395

    Publication date:

    2003-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Deconvolution of very low primary energy SIMS depth profiles

    Fares, B. / Gautier, B. / Dupuy, J. C. et al. | British Library Online Contents | 2006

    D-SIMS and ToF-SIMS quantitative depth profiles comparison on ultra thin oxynitrides

    Bersani, M. / Giubertoni, D. / Barozzi, M. et al. | British Library Online Contents | 2003

    Deconvolution of SIMS depth profiles: Towards simple and faster techniques

    Boulsina, F. / Berrabah, M. / Dupuy, J. C. | British Library Online Contents | 2008

    SIMS-AMS depth profiles for NASA Genesis samples: Preliminary measurements

    Cetina, C. / Grabowski, K. S. / Knies, D. L. et al. | British Library Online Contents | 2008

    Recovery of SIMS depth profiles with account for nonstationary effects

    Yunin, P. A. / Drozdov, Y. N. / Drozdov, M. N. et al. | British Library Online Contents | 2014

    Back to top