SIMS-AMS depth profiles for NASA Genesis samples: Preliminary measurements: Fid-Bau Portal

SIMS-AMS depth profiles for NASA Genesis samples: Preliminary measurements

Cetina, C. / Grabowski, K. S. / Knies, D. L. / Demoranville, L. T.

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SIMS-AMS depth profiles for NASA Genesis samples: Preliminary measurements

Cetina, C. / Grabowski, K. S. / Knies, D. L. / Demoranville, L. T.

SIMS-AMS depth profiles for NASA Genesis samples: Preliminary measurements

Cetina, C. / Grabowski, K. S. / Knies, D. L. / Demoranville, L. T.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

SIMS-AMS depth profiles for NASA Genesis samples: Preliminary measurements

Contributors:

Cetina, C. (author) / Grabowski, K. S. (author) / Knies, D. L. (author) / Demoranville, L. T. (author)

Published in:

APPLIED SURFACE SCIENCE ; 255 ; 1479-1481

Publication date:

2008-01-01

Size:

3 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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