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D-SIMS and ToF-SIMS quantitative depth profiles comparison on ultra thin oxynitrides
D-SIMS and ToF-SIMS quantitative depth profiles comparison on ultra thin oxynitrides
D-SIMS and ToF-SIMS quantitative depth profiles comparison on ultra thin oxynitrides
Bersani, M. (author) / Giubertoni, D. (author) / Barozzi, M. (author) / EIacob, E. (author) / Vanzetti, L. (author) / Anderle, M. (author) / Lazzeri, P. (author) / Crivelli, B. (author) / Zanderigo, F. (author)
APPLIED SURFACE SCIENCE ; 203-204 ; 281-284
2003-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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