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Time-of-flight-SIMS and XPS characterization of metal doped polymers

Gross, T. / Retzko, I. / Friedrich, J. / Unger, W.

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Time-of-flight-SIMS and XPS characterization of metal doped polymers

Gross, T. / Retzko, I. / Friedrich, J. / Unger, W.

Time-of-flight-SIMS and XPS characterization of metal doped polymers

Gross, T. / Retzko, I. / Friedrich, J. / Unger, W.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Time-of-flight-SIMS and XPS characterization of metal doped polymers

Contributors:

Gross, T. (author) / Retzko, I. (author) / Friedrich, J. (author) / Unger, W. (author)

Published in:

APPLIED SURFACE SCIENCE ; 203-204 ; 575-579

Publication date:

2003-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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