Time-of-flight secondary ion mass spectrometry (TOF-SIMS) for high-throughput characterization of biosurfaces: Fid-Bau Portal

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) for high-throughput characterization of biosurfaces

Roberson, S. / Sehgal, A. / Fahey, A. / Karim, A.

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Time-of-flight secondary ion mass spectrometry (TOF-SIMS) for high-throughput characterization of biosurfaces

Roberson, S. / Sehgal, A. / Fahey, A. / Karim, A.

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) for high-throughput characterization of biosurfaces

Roberson, S. / Sehgal, A. / Fahey, A. / Karim, A.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) for high-throughput characterization of biosurfaces

Contributors:

Roberson, S. (author) / Sehgal, A. (author) / Fahey, A. (author) / Karim, A. (author)

Published in:

APPLIED SURFACE SCIENCE ; 203-204 ; 855-858

Publication date:

2003-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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