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Structural characterization of various ionomers by time-of-flight secondary ion mass spectrometry

Lee, Y. / Han, S. / Kwon, M. H. / Lim, H. / Kim, Y. S. / Chun, H. / Kim, J. S.

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Structural characterization of various ionomers by time-of-flight secondary ion mass spectrometry

Lee, Y. / Han, S. / Kwon, M. H. / Lim, H. / Kim, Y. S. / Chun, H. / Kim, J. S.

Structural characterization of various ionomers by time-of-flight secondary ion mass spectrometry

Lee, Y. / Han, S. / Kwon, M. H. / Lim, H. / Kim, Y. S. / Chun, H. / Kim, J. S.

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Document information

Title:

Structural characterization of various ionomers by time-of-flight secondary ion mass spectrometry

Contributors:

Lee, Y. (author) / Han, S. (author) / Kwon, M. H. (author) / Lim, H. (author) / Kim, Y. S. (author) / Chun, H. (author) / Kim, J. S. (author)

Published in:

APPLIED SURFACE SCIENCE ; 203-204 ; 875-879

Publication date:

2003-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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