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    Zn channeled implantation in GaN: damages investigated by using high resolution XTEM and channeling RBS

    New search for: Ding, F. R.
    New search for: He, W.
    New search for: Vantomme, A.
    New search for: Zhao, Q.
    New search for: Pipeleers, B.
    New search for: Jacobs, K.
    New search for: Moerman, I.

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    Zn channeled implantation in GaN: damages investigated by using high resolution XTEM and channeling RBS

    New search for: Ding, F. R.
    New search for: He, W.
    New search for: Vantomme, A.
    New search for: Zhao, Q.
    New search for: Pipeleers, B.
    New search for: Jacobs, K.
    New search for: Moerman, I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Zn channeled implantation in GaN: damages investigated by using high resolution XTEM and channeling RBS

    New search for: Ding, F. R.
    New search for: He, W.
    New search for: Vantomme, A.
    New search for: Zhao, Q.
    New search for: Pipeleers, B.
    New search for: Jacobs, K.
    New search for: Moerman, I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Zn channeled implantation in GaN: damages investigated by using high resolution XTEM and channeling RBS

    Contributors:

    Ding, F. R. (author) / He, W. (author) / Vantomme, A. (author) / Zhao, Q. (author) / Pipeleers, B. (author) / Jacobs, K. (author) / Moerman, I. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 98 ; 70-73

    Publication date:

    2003-01-01

    Size:

    4 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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