Surface analysis for LiBq4 growing on ITO and CuPc film using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS): Fid-Bau Portal

Surface analysis for LiBq4 growing on ITO and CuPc film using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS)

Gu-ping, O. / Wen-ming, G. / Shi-chao, J. / Fu-jia, Z.

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Surface analysis for LiBq4 growing on ITO and CuPc film using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS)

Gu-ping, O. / Wen-ming, G. / Shi-chao, J. / Fu-jia, Z.

Surface analysis for LiBq4 growing on ITO and CuPc film using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS)

Gu-ping, O. / Wen-ming, G. / Shi-chao, J. / Fu-jia, Z.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Surface analysis for LiBq4 growing on ITO and CuPc film using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS)

Contributors:

Gu-ping, O. (author) / Wen-ming, G. (author) / Shi-chao, J. (author) / Fu-jia, Z. (author)

Published in:

APPLIED SURFACE SCIENCE ; 252 ; 3417-3427

Publication date:

2006-01-01

Size:

11 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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