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    A structural analysis of Bi/Si(1 0 0) 2 x n surfaces by ICISS

    New search for: Oishi, N.
    New search for: Saitoh, N.
    New search for: Naitoh, M.
    New search for: Nishigaki, S.
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    New search for: Nakanishi, S.
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    A structural analysis of Bi/Si(1 0 0) 2 x n surfaces by ICISS

    New search for: Oishi, N.
    New search for: Saitoh, N.
    New search for: Naitoh, M.
    New search for: Nishigaki, S.
    New search for: Shoji, F.
    New search for: Nakanishi, S.
    New search for: Umezawa, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    A structural analysis of Bi/Si(1 0 0) 2 x n surfaces by ICISS

    New search for: Oishi, N.
    New search for: Saitoh, N.
    New search for: Naitoh, M.
    New search for: Nishigaki, S.
    New search for: Shoji, F.
    New search for: Nakanishi, S.
    New search for: Umezawa, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    A structural analysis of Bi/Si(1 0 0) 2 x n surfaces by ICISS

    Contributors:

    Oishi, N. (author) / Saitoh, N. (author) / Naitoh, M. (author) / Nishigaki, S. (author) / Shoji, F. (author) / Nakanishi, S. (author) / Umezawa, K. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 212-213 ; 373-377

    Publication date:

    2003-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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