Photoreflectance study of changes in the QW profile of 1.55-micrometer laser structure induced by SiO2 cap layers: Fid-Bau Portal

Photoreflectance study of changes in the QW profile of 1.55-micrometer laser structure induced by SiO2 cap layers

Kudrawiec, R. / Sek, G. / Rudno-Rudzinski, W. / Misiewicz, J. / Wojcik, J. / Robinson, B. J. / Thompson, D. A. / Mascher, P.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Photoreflectance study of changes in the QW profile of 1.55-micrometer laser structure induced by SiO2 cap layers

Kudrawiec, R. / Sek, G. / Rudno-Rudzinski, W. / Misiewicz, J. / Wojcik, J. / Robinson, B. J. / Thompson, D. A. / Mascher, P.

Photoreflectance study of changes in the QW profile of 1.55-micrometer laser structure induced by SiO2 cap layers

Kudrawiec, R. / Sek, G. / Rudno-Rudzinski, W. / Misiewicz, J. / Wojcik, J. / Robinson, B. J. / Thompson, D. A. / Mascher, P.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Photoreflectance study of changes in the QW profile of 1.55-micrometer laser structure induced by SiO2 cap layers

Contributors:

Kudrawiec, R. (author) / Sek, G. (author) / Rudno-Rudzinski, W. (author) / Misiewicz, J. (author) / Wojcik, J. (author) / Robinson, B. J. (author) / Thompson, D. A. (author) / Mascher, P. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 101 ; 232-235

Publication date:

2003-01-01

Size:

4 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Bru-Chevallier, C. / Chouaib, H. / Bakouboula, A. et al. | British Library Online Contents | 2006

Photoreflectance investigations of GaN epitaxial layers

Sitarek, P. / Kudrawiec, R. / Sek, G. et al. | British Library Online Contents | 2001

Room temperature photoreflectance of different electron concentration GaN epitaxial layers

Kudrawiec, R. / Sek, G. / Misiewicz, J. et al. | British Library Online Contents | 2002

Photoreflectance study of crystalline silicon

Moriya, H. / Kaneta, A. / Adachi, S. | British Library Online Contents | 2000

Infrared spectroscopic ellipsometry of micrometer-sized SiO2 line gratings

Walder, Cordula / Zellmeier, Matthias / Rappich, Jörg et al. | British Library Online Contents | 2017