Minority carrier lifetime and metallic-impurity mapping in silicon wafers

Palais, O. / Martinuzzi, S. / Simon, J. J. | British Library Online Contents | 2001

Mapping of minority carrier lifetime and mobility in imperfect silicon wafers

Palais, O. / Clerc, L. / Arcari, A. et al. | British Library Online Contents | 2003

Minority carrier lifetime scan maps applied to iron concentration mapping in silicon wafers

Palais, O. / Yakimov, E. / Martinuzzi, S. | British Library Online Contents | 2002

High-Resolution Time-Resolved Carrier Lifetime and Photoluminescence Mapping of 4H-SiC Epilayers

Booker, I.D. / Hassan, J. / Janzen, E. et al. | British Library Online Contents | 2012

Room-temperature scanning photoluminescence for mapping the lifetime and the doping density in compound semiconductors

Krawczyk, S. K. / Nuban, M. F. | British Library Online Contents | 1994