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    Correlation between Defects and Electrical Properties of 4H-SiC Based Schottky Diodes

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    Correlation between Defects and Electrical Properties of 4H-SiC Based Schottky Diodes

    New search for: Scaltrito, L.
    New search for: Porro, S.
    New search for: Giorgis, F.
    New search for: Mandracci, P.
    New search for: Cocuzza, M.
    New search for: Pirri, C. F.
    New search for: Ricciardi, C.
    New search for: Ferrero, S.
    New search for: Richieri, G.
    New search for: Sgorlon, C.
    New search for: Bergman, P.
    New search for: Janzen, E.

    Access

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    Correlation between Defects and Electrical Properties of 4H-SiC Based Schottky Diodes

    New search for: Scaltrito, L.
    New search for: Porro, S.
    New search for: Giorgis, F.
    New search for: Mandracci, P.
    New search for: Cocuzza, M.
    New search for: Pirri, C. F.
    New search for: Ricciardi, C.
    New search for: Ferrero, S.
    New search for: Richieri, G.
    New search for: Sgorlon, C.
    New search for: Bergman, P.
    New search for: Janzen, E.

    Access

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    Document information
    Title:

    Correlation between Defects and Electrical Properties of 4H-SiC Based Schottky Diodes

    Contributors:

    Scaltrito, L. (author) / Porro, S. (author) / Giorgis, F. (author) / Mandracci, P. (author) / Cocuzza, M. (author) / Pirri, C. F. (author) / Ricciardi, C. (author) / Ferrero, S. (author) / Richieri, G. (author) / Sgorlon, C. (author)

    Published in:

    Silicon Carbide and Related Materials 2002 ; 455-458

    MATERIALS SCIENCE FORUM ; 433/436

    Publication date:

    2003-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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