Identification and Annealing of Common Intrinsic Defect Centers: Fid-Bau Portal

Identification and Annealing of Common Intrinsic Defect Centers

Bockstedte, M. / Heid, M. / Mattausch, A. / Pankratov, O.

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Identification and Annealing of Common Intrinsic Defect Centers

Bockstedte, M. / Heid, M. / Mattausch, A. / Pankratov, O.

Identification and Annealing of Common Intrinsic Defect Centers

Bockstedte, M. / Heid, M. / Mattausch, A. / Pankratov, O.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Identification and Annealing of Common Intrinsic Defect Centers

Contributors:

Bockstedte, M. (author) / Heid, M. (author) / Mattausch, A. (author) / Pankratov, O. (author) / Bergman, P. / Janzen, E.

Published in:

Silicon Carbide and Related Materials 2002 ; 471-476

MATERIALS SCIENCE FORUM ; 433/436

Publication date:

2003-01-01

Size:

6 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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