Characterisation of the High Temperature Performance of 4H-SiC Schottky Barrier Diodes: Fid-Bau Portal

Characterisation of the High Temperature Performance of 4H-SiC Schottky Barrier Diodes

Blasciuc-Dimitriu, C. / Horsfall, A. B. / Vassilevski, K. V. / Johnson, C. M. / Wright, N. G. / O Neill, A. G.

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Characterisation of the High Temperature Performance of 4H-SiC Schottky Barrier Diodes

Blasciuc-Dimitriu, C. / Horsfall, A. B. / Vassilevski, K. V. / Johnson, C. M. / Wright, N. G. / O Neill, A. G.

Characterisation of the High Temperature Performance of 4H-SiC Schottky Barrier Diodes

Blasciuc-Dimitriu, C. / Horsfall, A. B. / Vassilevski, K. V. / Johnson, C. M. / Wright, N. G. / O Neill, A. G.

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Title:

Characterisation of the High Temperature Performance of 4H-SiC Schottky Barrier Diodes

Contributors:

Blasciuc-Dimitriu, C. (author) / Horsfall, A. B. (author) / Vassilevski, K. V. (author) / Johnson, C. M. (author) / Wright, N. G. (author) / O Neill, A. G. (author) / Bergman, P. / Janzen, E.

Published in:

Silicon Carbide and Related Materials 2002 ; 823-826

MATERIALS SCIENCE FORUM ; 433/436

Publication date:

2003-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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