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    Effects of Nitrogen Radical Irradiation on Performance of SiC MOSFETs

    New search for: Yano, H.
    New search for: Maeyama, Y.
    New search for: Furumoto, Y.
    New search for: Hatayama, T.
    New search for: Uraoka, Y.
    New search for: Fuyuki, T.
    New search for: Bergman, P.
    New search for: Janzen, E.

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    Effects of Nitrogen Radical Irradiation on Performance of SiC MOSFETs

    New search for: Yano, H.
    New search for: Maeyama, Y.
    New search for: Furumoto, Y.
    New search for: Hatayama, T.
    New search for: Uraoka, Y.
    New search for: Fuyuki, T.
    New search for: Bergman, P.
    New search for: Janzen, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Effects of Nitrogen Radical Irradiation on Performance of SiC MOSFETs

    New search for: Yano, H.
    New search for: Maeyama, Y.
    New search for: Furumoto, Y.
    New search for: Hatayama, T.
    New search for: Uraoka, Y.
    New search for: Fuyuki, T.
    New search for: Bergman, P.
    New search for: Janzen, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Effects of Nitrogen Radical Irradiation on Performance of SiC MOSFETs

    Contributors:

    Yano, H. (author) / Maeyama, Y. (author) / Furumoto, Y. (author) / Hatayama, T. (author) / Uraoka, Y. (author) / Fuyuki, T. (author) / Bergman, P. / Janzen, E.

    Published in:

    Silicon Carbide and Related Materials 2002 ; 945-948

    MATERIALS SCIENCE FORUM ; 433/436

    Publication date:

    2003-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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