Characterization of ferroelectric ceramics using x-ray diffraction, transmission electron microscopy, and x-ray photoelectron spectroscopy: Fid-Bau Portal

Characterization of ferroelectric ceramics using x-ray diffraction, transmission electron microscopy, and x-ray photoelectron spectroscopy

Kim, J.-N. / Shin, K.-S. / Park, B.-O. / Lee, J.-H. / Kim, N.-K. / Cho, S.-H.

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Characterization of ferroelectric ceramics using x-ray diffraction, transmission electron microscopy, and x-ray photoelectron spectroscopy

Kim, J.-N. / Shin, K.-S. / Park, B.-O. / Lee, J.-H. / Kim, N.-K. / Cho, S.-H.

Characterization of ferroelectric ceramics using x-ray diffraction, transmission electron microscopy, and x-ray photoelectron spectroscopy

Kim, J.-N. / Shin, K.-S. / Park, B.-O. / Lee, J.-H. / Kim, N.-K. / Cho, S.-H.

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Check availability in my library

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Document information

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Document information

Title:

Characterization of ferroelectric ceramics using x-ray diffraction, transmission electron microscopy, and x-ray photoelectron spectroscopy

Contributors:

Kim, J.-N. (author) / Shin, K.-S. (author) / Park, B.-O. (author) / Lee, J.-H. (author) / Kim, N.-K. (author) / Cho, S.-H. (author)

Published in:

SMART MATERIALS AND STRUCTURES ; 12 ; 565-570

Publication date:

2003-01-01

Size:

6 pages

ISSN:

0964-1726

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 530

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