A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Two-dimensional interstitial diffusion in silicon monitored by scanning capacitance microscopy
Two-dimensional interstitial diffusion in silicon monitored by scanning capacitance microscopy
Two-dimensional interstitial diffusion in silicon monitored by scanning capacitance microscopy
Giannazzo, F. (author) / Mirabella, S. (author) / Raineri, V. (author) / De Salvador, D. (author) / Napolitani, E. (author) / Terrasi, A. (author) / Carnera, A. (author) / Drigo, A. V. (author) / Priolo, F. (author)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 102 ; 148-151
2003-01-01
4 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Two dimensional boron diffusion determination by scanning capacitance microscopy
| British Library Online Contents | 2002
Two-Dimensional Dopant Profiling by Scanning Capacitance Microscopy
| British Library Online Contents | 1999
Two-dimensional dopant profiling by scanning capacitance force microscopy
| British Library Online Contents | 2003
Evaluation of different oxidation methods for silicon for scanning capacitance microscopy
| British Library Online Contents | 2001
Microfracture in wood monitored by confocal laser scanning microscopy
| British Library Online Contents | 2002