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    Crystallographic defects under device-killing surface faults in a homoepitaxially grown film of SiC

    New search for: Okada, T.
    New search for: Kimoto, T.
    New search for: Yamai, K.
    New search for: Matsunami, H.
    New search for: Inoko, F.

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    Crystallographic defects under device-killing surface faults in a homoepitaxially grown film of SiC

    New search for: Okada, T.
    New search for: Kimoto, T.
    New search for: Yamai, K.
    New search for: Matsunami, H.
    New search for: Inoko, F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Crystallographic defects under device-killing surface faults in a homoepitaxially grown film of SiC

    New search for: Okada, T.
    New search for: Kimoto, T.
    New search for: Yamai, K.
    New search for: Matsunami, H.
    New search for: Inoko, F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Crystallographic defects under device-killing surface faults in a homoepitaxially grown film of SiC

    Contributors:

    Okada, T. (author) / Kimoto, T. (author) / Yamai, K. (author) / Matsunami, H. (author) / Inoko, F. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING A ; 361 ; 67-74

    Publication date:

    2003-01-01

    Size:

    8 pages

    ISSN:

    0921-5093

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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