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    Laser crystallization of amorphous silicon films investigated by Raman spectroscopy and atomic force microscopy

    New search for: Jin, J.
    New search for: Yuan, Z.
    New search for: Huang, L.
    New search for: Chen, S.
    New search for: Shi, W.
    New search for: Cao, Z.
    New search for: Lou, Q.

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    Laser crystallization of amorphous silicon films investigated by Raman spectroscopy and atomic force microscopy

    New search for: Jin, J.
    New search for: Yuan, Z.
    New search for: Huang, L.
    New search for: Chen, S.
    New search for: Shi, W.
    New search for: Cao, Z.
    New search for: Lou, Q.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Laser crystallization of amorphous silicon films investigated by Raman spectroscopy and atomic force microscopy

    New search for: Jin, J.
    New search for: Yuan, Z.
    New search for: Huang, L.
    New search for: Chen, S.
    New search for: Shi, W.
    New search for: Cao, Z.
    New search for: Lou, Q.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Laser crystallization of amorphous silicon films investigated by Raman spectroscopy and atomic force microscopy

    Contributors:

    Jin, J. (author) / Yuan, Z. (author) / Huang, L. (author) / Chen, S. (author) / Shi, W. (author) / Cao, Z. (author) / Lou, Q. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 256 ; 3453-3458

    Publication date:

    2010-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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