Structural analysis of NiO ultra-thin films epitaxially grown on ultra-smooth sapphire substrates by synchrotron X-ray diffraction measurements: Fid-Bau Portal

Structural analysis of NiO ultra-thin films epitaxially grown on ultra-smooth sapphire substrates by synchrotron X-ray diffraction measurements

Sakata, O. / Yi, M. S. / Matsuda, A. / Liu, J. / Sato, S. / Akiba, S. / Sasaki, A. / Yoshimoto, M.

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Structural analysis of NiO ultra-thin films epitaxially grown on ultra-smooth sapphire substrates by synchrotron X-ray diffraction measurements

Sakata, O. / Yi, M. S. / Matsuda, A. / Liu, J. / Sato, S. / Akiba, S. / Sasaki, A. / Yoshimoto, M.

Structural analysis of NiO ultra-thin films epitaxially grown on ultra-smooth sapphire substrates by synchrotron X-ray diffraction measurements

Sakata, O. / Yi, M. S. / Matsuda, A. / Liu, J. / Sato, S. / Akiba, S. / Sasaki, A. / Yoshimoto, M.

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Title:

Structural analysis of NiO ultra-thin films epitaxially grown on ultra-smooth sapphire substrates by synchrotron X-ray diffraction measurements

Contributors:

Sakata, O. (author) / Yi, M. S. (author) / Matsuda, A. (author) / Liu, J. (author) / Sato, S. (author) / Akiba, S. (author) / Sasaki, A. (author) / Yoshimoto, M. (author)

Published in:

APPLIED SURFACE SCIENCE ; 221 ; 450-454

Publication date:

2004-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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