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Depth dependences of the ion bombardment induced roughness and of the interdiffusion coefficient for Si/Al multilayers
Depth dependences of the ion bombardment induced roughness and of the interdiffusion coefficient for Si/Al multilayers
Depth dependences of the ion bombardment induced roughness and of the interdiffusion coefficient for Si/Al multilayers
Wang, J. Y. (author) / Zalar, A. (author) / Mittemeijer, E. J. (author)
APPLIED SURFACE SCIENCE ; 222 ; 171-179
2004-01-01
9 pages
Article (Journal)
English
DDC:
621.35
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