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Structural investigation of CoMnGe combinatorial epitaxial thin films using microfocused synchrotron X-ray
Structural investigation of CoMnGe combinatorial epitaxial thin films using microfocused synchrotron X-ray
Structural investigation of CoMnGe combinatorial epitaxial thin films using microfocused synchrotron X-ray
Chu, Y. S. (author) / Tkachuk, A. (author) / Vogt, S. (author) / Ilinski, P. (author) / Walko, D. A. (author) / Mancini, D. C. (author) / Dufresne, E. M. (author) / He, L. (author) / Tsui, F. (author)
APPLIED SURFACE SCIENCE ; 223 ; 175-182
2004-01-01
8 pages
Article (Journal)
English
DDC:
621.35
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