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Comparative study of point defects induced in PbTe thin films doped with Ga by different techniques

Samoylov, A. M. / Buchnev, S. A. / Khoviv, A. M. / Dolgopolova, E. A. / Zlomanov, V. P.

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Comparative study of point defects induced in PbTe thin films doped with Ga by different techniques

Samoylov, A. M. / Buchnev, S. A. / Khoviv, A. M. / Dolgopolova, E. A. / Zlomanov, V. P.

Comparative study of point defects induced in PbTe thin films doped with Ga by different techniques

Samoylov, A. M. / Buchnev, S. A. / Khoviv, A. M. / Dolgopolova, E. A. / Zlomanov, V. P.

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Document information

Title:

Comparative study of point defects induced in PbTe thin films doped with Ga by different techniques

Contributors:

Samoylov, A. M. (author) / Buchnev, S. A. (author) / Khoviv, A. M. (author) / Dolgopolova, E. A. (author) / Zlomanov, V. P. (author)

Published in:

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 6 ; 481-485

Publication date:

2003-01-01

Size:

5 pages

ISSN:

1369-8001

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.38152

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