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Surface morphological influence on charging at metal-insulator interface in XPS depth profiling

Mori, Y. / Tanemura, M. / Tanemura, S.

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Surface morphological influence on charging at metal-insulator interface in XPS depth profiling

Mori, Y. / Tanemura, M. / Tanemura, S.

Surface morphological influence on charging at metal-insulator interface in XPS depth profiling

Mori, Y. / Tanemura, M. / Tanemura, S.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

Similar titles

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Document information

Title:

Surface morphological influence on charging at metal-insulator interface in XPS depth profiling

Contributors:

Mori, Y. (author) / Tanemura, M. (author) / Tanemura, S. (author)

Published in:

APPLIED SURFACE SCIENCE ; 228 ; 292-296

Publication date:

2004-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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