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Surface morphological influence on charging at metal-insulator interface in XPS depth profiling
Surface morphological influence on charging at metal-insulator interface in XPS depth profiling
Surface morphological influence on charging at metal-insulator interface in XPS depth profiling
Mori, Y. (Autor:in) / Tanemura, M. (Autor:in) / Tanemura, S. (Autor:in)
APPLIED SURFACE SCIENCE ; 228 ; 292-296
01.01.2004
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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