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High Frequency Measurements and Simulations of SiC MESFETs up to 250^oC
High Frequency Measurements and Simulations of SiC MESFETs up to 250^oC
High Frequency Measurements and Simulations of SiC MESFETs up to 250^oC
Liu, W. (author) / Zetterling, C. M. (author) / Ostling, M. (author) / Eriksson, J. (author) / Rorsman, N. (author) / Zirath, H. (author)
MATERIALS SCIENCE FORUM ; 457/460 ; 1209-1212
2004-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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