Photo-EPR and Hall Measurements on Undoped High Purity Semi-Insulating 4H-SiC Substrates: Fid-Bau Portal

Photo-EPR and Hall Measurements on Undoped High Purity Semi-Insulating 4H-SiC Substrates

Kalabukhova, E. N. / Lukin, S. N. / Savchenko, D. V. / Mitchel, W. C. / Mitchell, W. D.

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Photo-EPR and Hall Measurements on Undoped High Purity Semi-Insulating 4H-SiC Substrates

Kalabukhova, E. N. / Lukin, S. N. / Savchenko, D. V. / Mitchel, W. C. / Mitchell, W. D.

Photo-EPR and Hall Measurements on Undoped High Purity Semi-Insulating 4H-SiC Substrates

Kalabukhova, E. N. / Lukin, S. N. / Savchenko, D. V. / Mitchel, W. C. / Mitchell, W. D.

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Check availability in my library

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Document information

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Document information

Title:

Photo-EPR and Hall Measurements on Undoped High Purity Semi-Insulating 4H-SiC Substrates

Contributors:

Kalabukhova, E. N. (author) / Lukin, S. N. (author) / Savchenko, D. V. (author) / Mitchel, W. C. (author) / Mitchell, W. D. (author)

Published in:

MATERIALS SCIENCE FORUM ; 457/460 ; 501-504

Publication date:

2004-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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