RF Performance and Reliability of SiC MESFETs on High Purity Semi-Insulating Substrates: Fid-Bau Portal

RF Performance and Reliability of SiC MESFETs on High Purity Semi-Insulating Substrates

Sriram, S. / Ward, A. / Janke, C. / Alcorn, T. / Hagleitner, H. / Henning, J. / Wieber, K. / Jenny, J. / Sumakeris, J. / Allen, S.

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RF Performance and Reliability of SiC MESFETs on High Purity Semi-Insulating Substrates

Sriram, S. / Ward, A. / Janke, C. / Alcorn, T. / Hagleitner, H. / Henning, J. / Wieber, K. / Jenny, J. / Sumakeris, J. / Allen, S.

RF Performance and Reliability of SiC MESFETs on High Purity Semi-Insulating Substrates

Sriram, S. / Ward, A. / Janke, C. / Alcorn, T. / Hagleitner, H. / Henning, J. / Wieber, K. / Jenny, J. / Sumakeris, J. / Allen, S.

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Title:

RF Performance and Reliability of SiC MESFETs on High Purity Semi-Insulating Substrates

Contributors:

Sriram, S. (author) / Ward, A. (author) / Janke, C. (author) / Alcorn, T. (author) / Hagleitner, H. (author) / Henning, J. (author) / Wieber, K. (author) / Jenny, J. (author) / Sumakeris, J. (author) / Allen, S. (author)

Published in:

MATERIALS SCIENCE FORUM ; 457/460 ; 1205-1208

Publication date:

2004-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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