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    Midgap Defects in 4H-, 6H- and 3C-SiC Detected by Deep Level Optical Spectroscopy

    New search for: Reshanov, S. A.
    New search for: Schneider, K.
    New search for: Helbig, R.
    New search for: Pensl, G.
    New search for: Nagasawa, H.
    New search for: Schoner, A.

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    Midgap Defects in 4H-, 6H- and 3C-SiC Detected by Deep Level Optical Spectroscopy

    New search for: Reshanov, S. A.
    New search for: Schneider, K.
    New search for: Helbig, R.
    New search for: Pensl, G.
    New search for: Nagasawa, H.
    New search for: Schoner, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Midgap Defects in 4H-, 6H- and 3C-SiC Detected by Deep Level Optical Spectroscopy

    New search for: Reshanov, S. A.
    New search for: Schneider, K.
    New search for: Helbig, R.
    New search for: Pensl, G.
    New search for: Nagasawa, H.
    New search for: Schoner, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
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    Document information
    Title:

    Midgap Defects in 4H-, 6H- and 3C-SiC Detected by Deep Level Optical Spectroscopy

    Contributors:

    Reshanov, S. A. (author) / Schneider, K. (author) / Helbig, R. (author) / Pensl, G. (author) / Nagasawa, H. (author) / Schoner, A. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 457/460 ; 513-516

    Publication date:

    2004-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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