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Optical Characterization of Deep Level Defects in SiC

Magnusson, B. / Janzen, E.

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Optical Characterization of Deep Level Defects in SiC

Magnusson, B. / Janzen, E.

Optical Characterization of Deep Level Defects in SiC

Magnusson, B. / Janzen, E.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Optical Characterization of Deep Level Defects in SiC

Contributors:

Magnusson, B. (author) / Janzen, E. (author) / Nipoti, R. / Poggi, A. / Scorzoni, A.

Published in:

Silicon Carbide and Related Materials 2004 ; 341-346

MATERIALS SCIENCE FORUM ; 483/485

Publication date:

2005-01-01

Size:

6 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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