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ToF-SIMS imaging with cluster ion beams

Xu, J. / Ostrowski, S. / Szakal, C. / Ewing, A. G. / Winograd, N.

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ToF-SIMS imaging with cluster ion beams

Xu, J. / Ostrowski, S. / Szakal, C. / Ewing, A. G. / Winograd, N.

ToF-SIMS imaging with cluster ion beams

Xu, J. / Ostrowski, S. / Szakal, C. / Ewing, A. G. / Winograd, N.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

ToF-SIMS imaging with cluster ion beams

Contributors:

Xu, J. (author) / Ostrowski, S. (author) / Szakal, C. (author) / Ewing, A. G. (author) / Winograd, N. (author)

Published in:

APPLIED SURFACE SCIENCE ; 231/232 ; 159-163

Publication date:

2004-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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