Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Factorial analysis of cluster-SIMS depth profiling using metal-cluster-complex ion beams

    New search for: Fujiwara, Y.
    New search for: Kondou, K.
    New search for: Watanabe, K.
    New search for: Nonaka, H.
    New search for: Saito, N.
    New search for: Fujimoto, T.
    New search for: Kurokawa, A.
    New search for: Ichimura, S.
    New search for: Tomita, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Factorial analysis of cluster-SIMS depth profiling using metal-cluster-complex ion beams

    New search for: Fujiwara, Y.
    New search for: Kondou, K.
    New search for: Watanabe, K.
    New search for: Nonaka, H.
    New search for: Saito, N.
    New search for: Fujimoto, T.
    New search for: Kurokawa, A.
    New search for: Ichimura, S.
    New search for: Tomita, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Factorial analysis of cluster-SIMS depth profiling using metal-cluster-complex ion beams

    New search for: Fujiwara, Y.
    New search for: Kondou, K.
    New search for: Watanabe, K.
    New search for: Nonaka, H.
    New search for: Saito, N.
    New search for: Fujimoto, T.
    New search for: Kurokawa, A.
    New search for: Ichimura, S.
    New search for: Tomita, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Factorial analysis of cluster-SIMS depth profiling using metal-cluster-complex ion beams

    Contributors:

    Fujiwara, Y. (author) / Kondou, K. (author) / Watanabe, K. (author) / Nonaka, H. (author) / Saito, N. (author) / Fujimoto, T. (author) / Kurokawa, A. (author) / Ichimura, S. (author) / Tomita, M. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 255 ; 1338-1340

    Publication date:

    2008-01-01

    Size:

    3 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Cluster SIMS using metal cluster complex ions

    Fujiwara, Y. / Kondou, K. / Teranishi, Y. et al. | British Library Online Contents | 2008

    Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)

    Mahoney, C. M. / Fahey, A. J. / Gillen, G. et al. | British Library Online Contents | 2006

    ToF-SIMS imaging with cluster ion beams

    Xu, J. / Ostrowski, S. / Szakal, C. et al. | British Library Online Contents | 2004

    SIMS depth profiling analysis of halogens in CdTe/CdS/TSO solar cells using Cs2M+ cluster ions

    Koudriavtseva, O. / Morales-Acevedo, A. / Kudriavtsev, Y. et al. | British Library Online Contents | 2008

    Molecular depth profiling and imaging using cluster ion beams with femtosecond laser postionization

    Willingham, D. / Kucher, A. / Winograd, N. | British Library Online Contents | 2008

    Back to top